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Jun 13th, 2012
A*STAR and UMC to develop TSV Technology for BSI image sensor for mobile applications
A*STAR Institute of Microelectronics (IME) and United Microelectronics Corporation, a leading global semiconductor foundry, have agreed to develop Through-Silicon Via (TSV) technology for backside illuminated CMOS image sensors (CIS).
The resulting technology will substantially enhance performance, lower costs and shrink the size of multi-megapixel image sensors found in mobile applications such as smart phones, digital cameras and tablet personal computers. Sources :
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