Analog Devices, Inc. (ADI), a global leader in high-performance semiconductors for signal-processing applications, has received a Silver “Best of Sensors Expo” award for the ADIS16223 iSensor® digital tri-axial vibration sensor. The ADIS16223 was recognized for its industry-leading integration, accuracy, and cost-efficiency. It is designed for industrial process equipment, including turbines, industrial motors and bearings, lifts, stability controls, robotics and any equipment where the ability to more easily isolate and monitor the vibration source leads to improved diagnostic accuracy or better maintenance.

The Sensors “Best of Sensors Expo” awards honor the most exciting new products that were on display at the Sensors Expo & Conference, which took place June 8-9 in Rosemont, IL. All entries were judged on the basis of potential impact, application, distinctiveness, timeliness, and availability.

“The awards program recognizes cutting-edge solutions in the sensors marketplace,” said Melanie Martella, executive editor of Sensors magazine. “All of the nominations demonstrated exceptional innovation, integration, and ease-of-use. We believe this year’s winners will be leaders in the sensors marketplace and offer our congratulations to the companies recognized.”

About the ADIS16223 iSensor Digital Tri-Axial Vibration Sensor
Analog Devices’ ADIS16223 iSensor accelerometer is a triple-axis, digital vibration sensor system that enables simple, effective, and affordable manufacturing equipment condition monitoring. The ADIS16223 combines ADI’s proprietary iMEMS® (integrated Micro Electro Mechanical System) technology with sensor signal processing, data capture, and a programmable SPI interface. The SPI and data buffer structure provide convenient access to wide-bandwidth sensor data, and allow user configurable embedded low and band-pass filtering. The ADIS16223’s 22-kHz sensor resonance and 72.9-kSPS sample rate are intentionally matched for optimal machine-health applications, providing the high-frequency monitoring that allows a system operator to identify failing equipment long before costly damage is sustained. An internal clock drives the data sampling system, filling the buffer memory for user access. The configurable embedded data capture saves system power, while allowing device tuning to multiple applications, as well as in-system adaption to end-equipment life-cycle changes.