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> COMPOUND SEMI RF ELECTRONICS
May 27th, 2010
Integra samples first 50V GaN-on-Si device
Leveraging a design team and internal wafer fabrication facility with nearly two years of R&D, at this week's IEEE MTT-S International Microwave Symposium (IMS 2010) in Anaheim, CA (25-27 May) high-power pulsed RF transistor maker Integra Technologies Inc (ITI) of El Segundo, CA, USA is launching two new products (available for sampling now) using what it claims is the first high-voltage gallium nitride on silicon HEMT process with drain-source breakdowns exceeding 200V.
The high breakdown voltage enables the devices to operate at higher voltages than seen on the market currently, translating into higher performance. Sources :
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