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Jun 25th, 2010
Nightingale-EOS Ltd unveils the n-Gauge™ metrology tool
Nightingale-EOS Limited (Wrexham, UK) has launched its first product, the n-Gauge™ metrology tool for characterising the thickness and material properties of thin film coatings on a wide range of devices
…and many others – wherever in fact there are thin transparent films to be measured. The tool utilises the unique Beam Profile Reflectometry (BPR) technology which has been successfully used in high-volume semiconductor manufacturing for many years. The n-Gauge makes this technology available in a smaller form-factor, at lower cost, and with more capability than ever before.
What it does
When the spot is located on a coated area, the reflected laser light can be automatically analysed to determine the thickness, refractive index, orientation and strain of the coating at that point. The tool is suitable for any translucent film, whether freestanding or on a substrate, with thicknesses in the range of a few nanometres up to tens of microns. Multilayer films can also be
The tool will be exhibited at the Medical Design and Manufacturing (MD&M) trade show in Minneapolis, 13th-14th October 2010, and the Commercial Micro Manufacturing (MM Live) trade show in Coventry, England, 19th-20th October 2010. Customers interested in seeing the system or requesting a demonstration in the meantime should contact the company directly.
Dr. Stephen Morris, the company’s founder and Managing Director, said “With the launch of the n- Gauge the unique Beam Profile Reflectometry technology, which was previously only available to high volume semiconductor manufacturers, becomes available for use in a wide range of industrial sectors. We believe that medical device and solar cell manufacturers, in particular, will benefit
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