N-Gauge interface

What it does
The n-Gauge’s user interface provides a high-quality magnified image of the sample being measured (in this example, a cardiac stent). In the centre of the field of view, a highly focused laser spot is visible.

When the spot is located on a coated area, the reflected laser light can be automatically analysed to determine the thickness, refractive index, orientation and strain of the coating at that point. The tool is suitable for any translucent film, whether freestanding or on a substrate, with thicknesses in the range of a few nanometres up to tens of microns. Multilayer films can also be
measured.

The tool will be exhibited at the Medical Design and Manufacturing (MD&M) trade show in Minneapolis, 13th-14th October 2010, and the Commercial Micro Manufacturing (MM Live) trade show in Coventry, England, 19th-20th October 2010. Customers interested in seeing the system or requesting a demonstration in the meantime should contact the company directly.

Dr. Stephen Morris, the company’s founder and Managing Director, said “With the launch of the n- Gauge the unique Beam Profile Reflectometry technology, which was previously only available to high volume semiconductor manufacturers, becomes available for use in a wide range of industrial sectors. We believe that medical device and solar cell manufacturers, in particular, will benefit
from its ability to make accurate ‘on-device’ measurements of coating thickness, strain and refractive index, even where the devices have complex shapes, high surface curvature or are otherwise difficult to align. This should significantly reduce the use of test coupons and off-line device analysis, and make it easier for medical device manufacturers to comply with the FDA’s
Process Analytical Technology (PAT) initiative.”