Glossary
Overview/Introduction p4
• Executive Summary
• Reverse Costing Methodology
Freescale Company Profile p8
Physical Analysis p12
• Synthesis of the physical analysis
• Physical analysis methodology
• Tire Pressure Monitoring System (TPMS)
• Multi-Chip Package
• Package characteristics & markings
• Package opening – Bondings Number
• Package opening – Encapsulation
• MCU markings
• MCU dimensions
• MCU minimal dimension and metal layers
• MCU process characteristics
• RFX markings
• RFX dimensions
• RFX minimal dimension and metal layers
• RFX process characteristics
• G-die markings & dimensions
• G-die : cap opening
• G-die : sensors dimensions
• G-die : x-axis structure
• G-die : x-axis process characteristics
• G-die : z-axis structure
• G-die : z-axis process characteristics
• G-die process characteristics
• P-die markings
• P-die dimensions
• P-die minimal dimension and metal layers
• P-die : sensors dimensions
• P-die : “Sense” sensor process characteristics
• P-die : “Reference” sensor process characteristics
• P-die process characteristics
Manufacturing Process Flow p56
• Overview
• MCU process flow
• RFX process flow
• G-die process flow : sensor wafer
• G-die process flow : cap wafer
• P-die process flow : ASIC
• P-die process flow : Sensor
• Description of the Wafer Fabrication Units
Cost Analysis p68
• Synthesis of the cost analysis
• Main steps of economic analysis
• Yields explanation
• MCU wafer cost
• MCU probe & dicing cost
• MCU die Cost
• RFX wafer cost
• RFX probe & dicing cost
• RFX die cost
• G-die wafer cost
• G-die wafer cost per step
• G-die probe & dicing cost
• G-die die cost
• P-die wafer cost
• P-die wafer cost per step
• P-die probe & dicing cost
• P-die die cost
• MPXY8300A packaging cost
• MPXY8300A final test cost
• MPXY8300A component manufacturing Cost
• Yield synthesis
Estimated Manufacturer Price Analysis p100
• Supply Chain Analysis
• Manufacturer ratios
• Estimated manufacturer Price
Conclusion