Glossary
Overview/Introduction
• Executive Summary
• Reverse Costing Methodology
InvenSense Company Profile
Physical analysis
• Synthesis of the Physical Analysis
• Physical Analysis Methodology
• Package Characteristics & Markings
• Package Opening & Bonding Number
• Device Structure
• Device Dimensions
• MEMS Sensor –Optical Views
• MEMS Sensor –X-Axis SEM Views
• MEMS Sensor –Y-Axis SEM Views
• MEMS Sensor –Z-Axis SEM Views
• ASIC –Overview
• ASIC –Markings & Bond Pads
• ASIC –Cavities
• ASIC –Delayering
• ASIC –Logic Area & Memory
• Component Cross-Sections
• ASIC Process Characteristics
• MEMS process characteristics
• Comparisons with Previous Generations
Manufacturing Process Flow
• Overview
• ASIC Process Flow (CMOS + Cavity Etch)
• MEMS Process Flow (Cap + Sensor + Assembly)
• Description of the Wafer Fabrication Unit
Cost Analysis
• Synthesis of the Cost Analysis
• Main Steps of Economic Analysis
• Yields Explanation
• Die per wafer & Probe Test
• Front-End Cost –Hypotheses
• ASIC Front-End Cost
• MEMS Front-End Cost
• MEMS Front-End Cost per Process Steps
• MEMS Front-End : Equipment Cost per Family
• MEMS Front-End : Material Cost per Family
• Total Front-End Cost (ASIC + MEMS + Assembly)
• Back-End 0 : Probe Test and Dicing
• Total Wafer Cost (Front-End + Back-End 0)
• Die cost
• Back-End 1 : Packaging Cost
• Back-End 1 : Final Test Cost
• ITG-3200 Component Cost (FE + BE 0 + BE 1)
Estimated Manufacturer Price Analysis
Conclusion