Glossary
Overview/Introduction..............................................p4
• Executive Summary
• Reverse Costing Methodology
STMicroelectronics Company Profile..................p6
iPhone 4 Teardown...................................................p12
Physical analysis.......................................................p15
•Synthesis of the Physical Analysis
•Physical Analysis Methodology
•Package Characteristics & Markings
•Package X-Ray
•Device Structure
•Package Opening
•ASIC – Dimensions
•ASIC – Markings
•ASIC – Bond Pads
•ASIC – Optical Views
•ASIC – Delayering
•ASIC – Cross-Section
•MEMS – Markings
•MEMS – Bond Pads
•MEMS – Dimensions
•MEMS – Cap Opening
•MEMS – Sensor Optical Views
•MEMS – Senor SEM Views
•MEMS – Cross-Section
•Process Characteristics
•Physical Data Summary
Manufacturing Process Flow..................................p58
•Global Overview
•ASIC Process Flow
•MEMS Process Overview
•MEMS Process Flow (Cap + Sensor + Bonding)
•Description of the Wafer Fabrication Units
Cost Analysis.............................................................p70
•Synthesis of the Cost Analysis
•Main Steps of Economic Analysis
•Yields Explanation
•Yields Hypotheses
•Die per wafer & Probe Test
•ASIC Front-End : Hypotheses
•ASIC Front-End Cost
•ASIC Back-End 0 : Probe Test, Backgrinding & Dicing
•MEMS Front-End : Hypotheses
•MEMS Front-End Cost
•MEMS Front-End Cost per Process Steps
•MEMS Front-End : Equipment Cost per Family
•MEMS Front-End : Material Cost per Family
•MEMS Back-End 0 : Probe Test & Dicing
•MEMS Die Cost (Front End + Back End 0)
•Back-End 1 : Packaging
•Back-End 1 : Final test & Calibration
•L3G4200D Component Cost (FE + BE 0 + BE 1)
Estimated Manufacturer Price Analysis.............p96
Conclusion................................................................p100