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NanoLambda NSP32-V1 Nano Spectrometer

3 490 €

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Yole couv flyer NanoLambda NSP32 V1 Spectrometer

First plasmonic filter sensor for consumer devices could disrupt optical applications

The NSP32-V1 from NanoLambda is the world’s smallest optical spectrometer, and the first such device for Internet-of-Things and handheld devices. It could enable everyday analysis of food and water, color measurement, health monitoring and pollution detection. The data measured by the NSP32-V1 is the same output format as conventional optical spectrum analyzers, which facilitates the use of this device without creating a new database.


The NSP32-V1 spectrometer uses a 1024 pixel, 32 x 32, nano-optical filter array to measure the light spectrum, based on a technological breakthrough, the plasmonic filter. This is a metal film perforated with subwavelength hole arrays. It is manufactured within the metal layer of the silicon die, giving a monolithic solution.


The 100μm-high sensor die is assembled in an advanced ball grid array (BGA) package with an optical window for only 500μm height. The other optical parts, the lens and the diffuser, are assembled in a 5.7mm-high module. The module is very small overall, at just 6mm x 6mm x 5.3mm.

NanoLambda NSP32 V1 Spectrometer Nano optical Filter array System Plus Consulting

Based on a complete teardown analysis of the NSP32-V1 nano-spectrometer, the report provides a complete physical analysis and manufacturing cost estimate of the die and the packaging, including the lens module.


The report also includes a comparison between the characteristics of the NSP32-V1 and the SCIO molecular sensor from Consumer Physics. The comparison highlights differences in technical choices made by the companies and their impacts on the process flow and manufacturing cost.

NanoLambda NSP32 V1 Spectrometer Module System Plus Consulting 2

NanoLambda NSP32 V1 Spectrometer cross section System Plus Consulting












Table of contents

Overview / Introduction



Company profile 



Physical Analysis

> Physical analysis methodology
Spectrometer Module
Module views and dimensions, cross-section and disassembly 
- Top package disassembly and cross-section: window, diffuser, reflector


Spectrometer Die
- Die view, dimensions and marking
- Nano-optical filter array
- Filter array view and dimensions
- Photodiode
- Filter cross-section
- Pads and pixels
- Die main block ID, process and cross section 
- Process characteristics


> Physical Comparison
- Die view, dimensions and marking




























Manufacturing Process Flow

> Overview of the Spectrometer Head
> Sensor Front-End Process Flow
> Sensor Wafer Fabrication Unit
> Package and Module Assembly Process
> Package Assembly Unit



Cost Analysis

> Overview of the Cost Analysis
> Yield Explanations and Hypotheses
> Sensor
- Sensor front-end cost
- Sensor back-end 0: probe Test, thinning and dicing
- Sensor wafer and die cost
- Package cost
- Module cost


> Component
- Spectrometer component cost



Estimated Price Analysis



About the authors


System Plus Consulting specializes in the cost analysis of electronics, from semiconductor devices to electronic systems.


Created more than 20 years ago, System Plus Consulting has developed a complete range of services, costing tools and reports to deliver in-depth production cost studies and estimate the objective selling price of a product.


System Plus Consulting engineers are experts in:

  • Integrated Circuits 
  • Power Devices & Modules 
  • MEMS & Sensors
  • Photonics 
  • LED 
  • Imaging 
  • Display 
  • Packaging 
  • Electronic Boards & Systems.

Through hundreds of analyses performed each year, System Plus Consulting offers deep added-value reports to help its customers understand their production processes and determine production costs. Based on System Plus Consulting’s results, manufacturers are able to compare their production costs to those of competitors.

System Plus Consulting is a sister company of Yole Développement.


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  • Detailed photos 

  • Precise measurements

  • Material analysis

  • Comparison between NanoLambda and SCIO spectrometers

  • Manufacturing process flow

  • Supply chain evaluation
  • Manufacturing cost analysis

  • Estimated sales price