Aehr Test Systems, a worldwide supplier of semiconductor test and reliability qualification equipment, will be showcasing its FOX-P™ multi-wafer test and burn-in solutions for high volume production and early failure rate (EFR) test of silicon photonic and laser devices at booth #3231 during the 2020 OFC Optical Networking and Communications Conference taking place March 10-12 in San Diego, CA at the San Diego Convention Center.
The FOX systems provide the ability to stabilize laser optical performance, which is critical for the silicon photonics market. Aehr will feature its FOX-XP™, FOX-NP™ and FOX-CP™ functional test and burn-in systems for single and multi-wafer, singulated die and modules.
Aehr Test President and CEO Gayn Erickson commented, “Aehr Test supplies complete test and burn-in solutions for engineering and production of laser and photonics devices to ensure they meet their initial quality and long-term reliability requirements of the data center, network and 5G infrastructure markets.”
Aehr is delivering wafer-level and singulated die/module engineering and production test and burn-in cost-effective solutions to meet new product design challenges.
“We are very optimistic about the silicon photonics market as a significant growth opportunity driver for Aehr. Market research company Yole Développement predicts silicon photonics technology will grow from being used in a few percent of the total optical transceiver market in 2016 to 35% of the market in 2025, with a market value for transceivers of almost $4 billion in 2025.”
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